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Description
- 【High-Precision Testing】Utilizes imported beryllium copper spring probes for excellent conductivity, ensuring stable performance under load and minimal deviation in test values.
- 【Innovative Probe Design】Features conical probes that resist rosin and solder adhesion, maintaining accuracy and reducing maintenance needs.
- 【Premium Construction】Crafted from high-quality aluminum alloy with a sleek sapphire color finish, combining durability with a fashionable aesthetic.
- 【User-Friendly Design】Incorporates a convenient locking mechanism for quick and easy setup, showcasing professional-grade functionality.
- 【Precision Alignment】Dual-headed probes align precisely with small holes, enhancing contact performance and ensuring accurate test data.
- 【Secure Board Mounting】Locking clasps hold the motherboard firmly in place, preventing warping and guaranteeing more precise test results.
Specifications:
- Material: Aluminum alloy body
- Probe Material: Imported beryllium copper
- Probe Type: Spring-loaded, conical tip
- Application: Motherboard layer testing for iPhone 16 series
In the box
- 1 x Motherboard Layered Test Fixture